发明名称 |
Devices, systems, and methods related to forming through-substrate vias with sacrificial plugs |
摘要 |
Methods for making semiconductor devices are disclosed herein. A method configured in accordance with a particular embodiment includes forming one or more openings in a front side of the semiconductor device and forming sacrificial plugs in the openings that partially fill the openings. The method further includes further filling the partially filled openings with a conductive material, where individual sacrificial plugs are generally between the conductive material and a substrate of the semiconductor device. The sacrificial plugs are exposed at a backside of the semiconductor device. Contact regions can be formed at the backside by removing the sacrificial plugs. |
申请公布号 |
US8859425(B2) |
申请公布日期 |
2014.10.14 |
申请号 |
US201213652033 |
申请日期 |
2012.10.15 |
申请人 |
Micron Technology, Inc. |
发明人 |
Kirby Kyle K.;Parekh Kunal R. |
分类号 |
H01L21/768 |
主分类号 |
H01L21/768 |
代理机构 |
Perkins Coie LLP |
代理人 |
Perkins Coie LLP |
主权项 |
1. A method of manufacturing a semiconductor device, comprising:
forming one or more openings in a front side of the semiconductor device that extend through a portion of a substrate of the semiconductor device and define a surface in the substrate at a bottom of the opening; forming sacrificial plugs in the openings; further filling the openings with a conductive material, wherein individual sacrificial plugs are generally between the conductive material and the surface in the substrate at the bottom of the opening; exposing the sacrificial plugs at a backside of the semiconductor device without exposing the conductive material at the backside; and forming contact regions aligned in the openings by removing the sacrificial plugs. |
地址 |
Boise ID US |