Test schemes and apparatus for passive interposers

摘要

A probe card includes a plurality of probe pins, and a switch network connected to the plurality of probe pins. The switch network is configured to connect the plurality of probe pins in a first pattern, and reconnect the plurality of probe pins in a second pattern different from the first pattern.

主权项

1. An apparatus comprising:
a probe card comprising: a plurality of probe pins, with neighboring ones of the plurality of probe pins having a first pitch; and a switch network connected to the plurality of probe pins, wherein the switch network is configured to:
connect the plurality of probe pins in a first pattern; andreconnect the plurality of probe pins in a second pattern different from the first pattern; and an interposer comprising a plurality of contact pads in contact with the plurality of probe pins, wherein neighboring ones of the plurality of contact pads have a second pitch smaller than the first pitch, and wherein the probe pins are placed in electrical contact with a first plurality of contact pads, and wherein, after the probe pins are placed in electrical contact with a first plurality of contact pads the position of the interposer is shifted to put the plurality of probe pins in contact with a second plurality of contact pads of the interposer different from the first plurality of contact pads.