发明名称 The test method of capacitance type touch screen panel using critical deformation
摘要 A TSP, to form a pattern by printing or deposition a Metal on an ITO, is a major factor in the interfacial adhesion between the ITO and the Metal. But adhesive strength of the interface can not be confirmed unless the destructive inspection by the method of a X-Cutting like. It is possible by using a Roller or a Vibrator thereunder which is patterned by any modification to the threshold of the TSP, and to prevent defects in the manufacturing process by its state.
申请公布号 KR101449397(B1) 申请公布日期 2014.10.14
申请号 KR20120072536 申请日期 2012.07.03
申请人 发明人
分类号 G01R27/26;G06F3/041 主分类号 G01R27/26
代理机构 代理人
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