| 摘要 |
PROBLEM TO BE SOLVED: To provide a piezoelectric property measuring device capable of measuring piezoelectric properties without allowing a piezoelectric material sample to stand.SOLUTION: A piezoelectric property measuring device 1 includes an electrically driven stand 2, first and second sample holding parts 3A and 3B and an elastic deformation part 5. The electrically driven stand 2 has a fixed part 21 and a movable part 22 and can freely adjust an interval between the fixed part 21 and the movable part 22. The first sample holding part 3A connected with the movable part 22 is freely attached and detached to and from the upper end of a piezoelectric material sample 10. The second sample holding part 3B connected with the fixed part 21 is freely attached and detached to and from the lower end part of the piezoelectric material sample 10. The elastic deformation part 5 is connected with between the movable part 22 and the first sample holding part 3A. The measuring device 1 measures a relation between an electric charge generated in the piezoelectric material sample 10 and a tensile load applied to the piezoelectric material sample 10. |
