发明名称 CHEMICAL MECHANICAL PLANARIZATION FOR BASE MATERIAL CONTAINING TUNGSTEN
摘要 PROBLEM TO BE SOLVED: To provide a chemical mechanical composition for a base material containing tungsten.SOLUTION: A tungsten chemical mechanical polishing (CMP) composition contains: a) 0.1 wt.% to 25 wt.% of silica, alumina, ceria, titania, zirconia, and nano-sized polishing agent selected from a group consisting of their combination; b) 0.1 wt.% to 0.5 wt.% of colloidal silica coated by an iron compound, colloid or nano-sized inorganic metal oxide particles coated by an iron compound, and solid catalyst of particles coated by an iron compound selected from a group consisting of their combination, c) 0.0001 wt.% to 0.5 wt.% of piperazine derivative, cyanate salt and chemical additive selected from a group consisting of their combination; d) 0.5 wt.% to 10 wt.% of oxidizing agent, and e) a carrier of liquid, and pH of the CMP composition is approximately 2.0 to approximately 8.0.
申请公布号 JP2014194016(A) 申请公布日期 2014.10.09
申请号 JP20140049128 申请日期 2014.03.12
申请人 AIR PRODUCTS AND CHEMICALS INC 发明人 SHI XIAOBO;ZHOU HONGJUN;BLAKE J LEW;JAMES ALLEN SCHLUETER;JO-ANN TERESA SCHWARTZ
分类号 C09K3/14;B24B37/00;C09G1/02;H01L21/304 主分类号 C09K3/14
代理机构 代理人
主权项
地址