发明名称 METHOD FOR MEASUREMENT USING TERAHERTZ WAVE
摘要 <p>PROBLEM TO BE SOLVED: To provide a method for measuring a characteristic value of a body to be measured with high precision in a relatively simple procedure by using a terahertz wave.SOLUTION: A method for measurement includes the steps of: arranging a reflection member to reflects a terahertz wave as an object at a predetermined position, and adjusting at least one of a reflective position and a direction between a measurement device and the reflection member over irradiation with the terahertz wave so that the terahertz wave reflected by the reflection member has a larger maximum amplitude of a time waveform; holding the time waveform of the terahertz wave reflected by the reflection member after the measurement device is adjusted; and arranging a body to be measured as an object, and adjusting at least one of a reflective position and a direction between the measurement device and reflection member over irradiation with terahertz wave so that a position where the terahertz wave reflected by the body to be measured has the maximum amplitude of the time waveform substantially matches the terahertz waveform has the maximum amplitude of the held waveform.</p>
申请公布号 JP2014194344(A) 申请公布日期 2014.10.09
申请号 JP20130069904 申请日期 2013.03.28
申请人 OTSUKA DENSHI CO LTD 发明人 KITAGISHI KEIKO;AKAGI MOTONOBU
分类号 G01N21/3586 主分类号 G01N21/3586
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