发明名称 DIELETRIC CAP HAVING MATERIAL WITH OPTICAL BAND GAP TO SUBSTANTIALLY BLOCK UV RADIATION DURING CURING TREATMENT, AND RELATED METHODS
摘要 A dielectric cap and related methods are disclosed. In one embodiment, the dielectric cap includes a dielectric material having an optical band gap (e.g., greater than about 3.0 electron-Volts) to substantially block ultraviolet radiation during a curing treatment, and including nitrogen with electron donor, double bond electrons. The dielectric cap exhibits a high modulus and is stable under post ULK UV curing treatments for, for example, copper low k back-end-of-line (BEOL) nanoelectronic devices, leading to less film and device cracking and improved reliability.
申请公布号 US2014302685(A1) 申请公布日期 2014.10.09
申请号 US201414307960 申请日期 2014.06.18
申请人 International Business Machines Corporation 发明人 Belyansky Michael P.;Bonilla Griselda;Liu Xiao Hu;Nguyen Son V.;Shaw Thomas M.;Shobha Hosadurga K.;Yang Daewon
分类号 H01L21/02 主分类号 H01L21/02
代理机构 代理人
主权项 1. A method of forming a dielectric cap, the method comprising: providing an inter-level dielectric (ILD); forming a dielectric material layer over the ILD, the dielectric material having an optical band gap that substantially blocks ultraviolet radiation and includes nitrogen with electron donor, double bond electrons; and curing the dielectric material layer using the ultraviolet radiation.
地址 Armonk NY US