发明名称 |
DIELETRIC CAP HAVING MATERIAL WITH OPTICAL BAND GAP TO SUBSTANTIALLY BLOCK UV RADIATION DURING CURING TREATMENT, AND RELATED METHODS |
摘要 |
A dielectric cap and related methods are disclosed. In one embodiment, the dielectric cap includes a dielectric material having an optical band gap (e.g., greater than about 3.0 electron-Volts) to substantially block ultraviolet radiation during a curing treatment, and including nitrogen with electron donor, double bond electrons. The dielectric cap exhibits a high modulus and is stable under post ULK UV curing treatments for, for example, copper low k back-end-of-line (BEOL) nanoelectronic devices, leading to less film and device cracking and improved reliability. |
申请公布号 |
US2014302685(A1) |
申请公布日期 |
2014.10.09 |
申请号 |
US201414307960 |
申请日期 |
2014.06.18 |
申请人 |
International Business Machines Corporation |
发明人 |
Belyansky Michael P.;Bonilla Griselda;Liu Xiao Hu;Nguyen Son V.;Shaw Thomas M.;Shobha Hosadurga K.;Yang Daewon |
分类号 |
H01L21/02 |
主分类号 |
H01L21/02 |
代理机构 |
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代理人 |
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主权项 |
1. A method of forming a dielectric cap, the method comprising:
providing an inter-level dielectric (ILD); forming a dielectric material layer over the ILD, the dielectric material having an optical band gap that substantially blocks ultraviolet radiation and includes nitrogen with electron donor, double bond electrons; and curing the dielectric material layer using the ultraviolet radiation. |
地址 |
Armonk NY US |