| 摘要 |
<p>Disclosed is a probe apparatus for hardware testing, comprising: a probe, and a probe pin and a transmission line that are disposed on the probe; and further comprising: a connection piece disposed on an upper surface of the probe, and a magnifying lens apparatus connected to the connection piece and used for magnifying a testing point. The connection piece is a guide way, and the magnifying lens apparatus is movably or fixedly connected to the guide way. The magnifying lens apparatus comprises: a magnifying lens, and an extension piece, having one end rotationally connected to the magnifying lens and the other end movably or fixedly connected to the guide way. In this utility model, the probe apparatus for hardware testing has a simple structure, and convenient use, and has a function of observing and magnifying a pin and a through hole, thereby improving convenience of using a conventional probe, and protecting a chip.</p> |
