发明名称 |
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME |
摘要 |
<p>PROBLEM TO BE SOLVED: To provide a microscopic transistor having high electrical characteristics with high yield; and achieve high performance, high reliability and high productivity of a semiconductor device including the transistor.SOLUTION: A semiconductor device comprises: a base insulation film; an oxide semiconductor film with a bottom face and lateral faces which are provided in the base insulation film and with an exposed top face; a source electrode and a drain electrode on the base insulation film and the oxide semiconductor film; a gate insulation film on the oxide semiconductor film, the source electrode and the drain electrode; and a gate electrode which overlaps the oxide semiconductor film on the gate insulation film.</p> |
申请公布号 |
JP2014195062(A) |
申请公布日期 |
2014.10.09 |
申请号 |
JP20140035105 |
申请日期 |
2014.02.26 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD |
发明人 |
SHIMOMURA AKIHISA;MORIWAKA TOMOAKI;ITO DAIGO |
分类号 |
H01L21/336;H01L21/8242;H01L21/8247;H01L27/108;H01L27/115;H01L29/786;H01L29/788;H01L29/792 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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