发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME
摘要 <p>PROBLEM TO BE SOLVED: To provide a microscopic transistor having high electrical characteristics with high yield; and achieve high performance, high reliability and high productivity of a semiconductor device including the transistor.SOLUTION: A semiconductor device comprises: a base insulation film; an oxide semiconductor film with a bottom face and lateral faces which are provided in the base insulation film and with an exposed top face; a source electrode and a drain electrode on the base insulation film and the oxide semiconductor film; a gate insulation film on the oxide semiconductor film, the source electrode and the drain electrode; and a gate electrode which overlaps the oxide semiconductor film on the gate insulation film.</p>
申请公布号 JP2014195062(A) 申请公布日期 2014.10.09
申请号 JP20140035105 申请日期 2014.02.26
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 SHIMOMURA AKIHISA;MORIWAKA TOMOAKI;ITO DAIGO
分类号 H01L21/336;H01L21/8242;H01L21/8247;H01L27/108;H01L27/115;H01L29/786;H01L29/788;H01L29/792 主分类号 H01L21/336
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