发明名称 METHOD FOR MANUFACTURING SILICON CARBIDE SEMICONDUCTOR DEVICE
摘要 A method for manufacturing a silicon carbide semiconductor device (1) includes the following steps. A silicon carbide substrate (80) including a first main surface (80b) and a second main surface (80a) opposite the first main surface (80b) is prepared. Etching the first main surface (80b) causes an etch pit (3a) including a micro pipe to appear on the first main surface (80b). Two-dimensional location information of the micro pipe on the first main surface (80b) is obtained. The silicon carbide substrate is cut into a plurality of chips (C12-C65). The chips (C12-C65) are selected on the basis of the two-dimensional location information. The first main surface (80b) is a silicon surface or a surface that is offset from the silicon surface by an angle of 10° or less. It is thereby possible to provide a method for manufacturing a silicon carbide semiconductor device capable of accurately selecting a chip including a micro pipe.
申请公布号 WO2014162775(A1) 申请公布日期 2014.10.09
申请号 WO2014JP52861 申请日期 2014.02.07
申请人 SUMITOMO ELECTRIC INDUSTRIES, LTD. 发明人 ITOH, SATOMI;TSUNO, TAKASHI
分类号 H01L21/66;H01L21/336;H01L29/12;H01L29/78 主分类号 H01L21/66
代理机构 代理人
主权项
地址
您可能感兴趣的专利