发明名称 |
METHOD FOR MANUFACTURING SILICON CARBIDE SEMICONDUCTOR DEVICE |
摘要 |
A method for manufacturing a silicon carbide semiconductor device (1) includes the following steps. A silicon carbide substrate (80) including a first main surface (80b) and a second main surface (80a) opposite the first main surface (80b) is prepared. Etching the first main surface (80b) causes an etch pit (3a) including a micro pipe to appear on the first main surface (80b). Two-dimensional location information of the micro pipe on the first main surface (80b) is obtained. The silicon carbide substrate is cut into a plurality of chips (C12-C65). The chips (C12-C65) are selected on the basis of the two-dimensional location information. The first main surface (80b) is a silicon surface or a surface that is offset from the silicon surface by an angle of 10° or less. It is thereby possible to provide a method for manufacturing a silicon carbide semiconductor device capable of accurately selecting a chip including a micro pipe. |
申请公布号 |
WO2014162775(A1) |
申请公布日期 |
2014.10.09 |
申请号 |
WO2014JP52861 |
申请日期 |
2014.02.07 |
申请人 |
SUMITOMO ELECTRIC INDUSTRIES, LTD. |
发明人 |
ITOH, SATOMI;TSUNO, TAKASHI |
分类号 |
H01L21/66;H01L21/336;H01L29/12;H01L29/78 |
主分类号 |
H01L21/66 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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