发明名称 |
CHARGE STORAGE APPARATUS AND METHODS |
摘要 |
Methods of forming multi-tiered semiconductor devices are described, along with apparatus and systems that include them. In one such method, an opening is formed in a tier of semiconductor material and a tier of dielectric. A portion of the tier of semiconductor material exposed by the opening is processed so that the portion is doped differently than the remaining semiconductor material in the tier. At least substantially all of the remaining semiconductor material of the tier is removed, leaving the differently doped portion of the tier of semiconductor material as a charge storage structure. A tunneling dielectric is formed on a first surface of the charge storage structure and an intergate dielectric is formed on a second surface of the charge storage structure. Additional embodiments are also described. |
申请公布号 |
US2014302650(A1) |
申请公布日期 |
2014.10.09 |
申请号 |
US201414310790 |
申请日期 |
2014.06.20 |
申请人 |
Micron Technology, Inc. |
发明人 |
Tang Sanh D.;Zahurak John K. |
分类号 |
H01L29/792 |
主分类号 |
H01L29/792 |
代理机构 |
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代理人 |
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主权项 |
1. A method comprising:
forming an opening in a tier of semiconductor material and a tier of dielectric; processing a portion of the tier of semiconductor material exposed by the opening so that the portion is doped differently than the remaining semiconductor material in the tier; removing at least substantially all of the remaining semiconductor material of the tier, wherein the differently doped portion of the tier of semiconductor material comprises a charge storage structure; forming a tunneling dielectric on a first surface of the charge storage structure; and forming an intergate dielectric on a second surface of the charge storage structure. |
地址 |
Boise ID US |