| 发明名称 |
SIGNAL EVALUATING DEVICE AND SIGNAL EVALUATING METHOD |
| 摘要 |
A signal evaluating device includes a binarizing device binarizing an input signal, a run length measuring device measuring a run length of a sign when there is a change in the sign that is the result of binarization of the input signal during an evaluating interval, using an output of the binarizing device as input, and an evaluating device calculating, from a measurement results of the run length measuring device, a distribution wherein a noise frequency distribution included in the input signal during the evaluating interval is assumed to be a geometric distribution, and evaluating whether or not the input signal is valid from a proportion of a total frequency of noise, obtained from the calculated distribution, and a total frequency that is the number of run lengths in the evaluating interval. |
| 申请公布号 |
US2014303936(A1) |
申请公布日期 |
2014.10.09 |
| 申请号 |
US201414309015 |
申请日期 |
2014.06.19 |
| 申请人 |
Azbil Corporation |
发明人 |
UENO Tatsuya |
| 分类号 |
G01J1/02 |
主分类号 |
G01J1/02 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A signal evaluating device comprising:
a binarizing device binarizing an input signal; a run length measuring device measuring a run length of a sign when there is a change in the sign that is the result of binarization of the input signal during an evaluating interval, using an output of the binarizing device as input; and an evaluating device calculating, from a measurement results of the run length measuring device, a distribution wherein a noise frequency distribution included in the input signal during the evaluating interval is assumed to be a geometric distribution, and evaluating whether or not the input signal is valid from a proportion of a total frequency of noise, obtained from the calculated distribution, and a total frequency that is the number of run lengths in the evaluating interval. |
| 地址 |
Tokyo JP |
