发明名称 Semiconductor Device and Method for Fabricating the Same
摘要 Provided is a semiconductor device. The semiconductor device includes a fin on a substrate; a gate electrode cross the fin on the substrate; a source/drain formed on at least one of both sides of the gate electrode, and including a first film and a second film; and a stress film arranged between an isolation film on the substrate and the source/drain, and formed on a side surface of the fin.
申请公布号 US2014299934(A1) 申请公布日期 2014.10.09
申请号 US201414194837 申请日期 2014.03.03
申请人 Samsung Electronics Co., Ltd. 发明人 KIM Seok-Hoon;KWON Tae-Ouk;JUNG Su-Jin;KIM Young-Pil;LEE Byeong-Chan;KOO Bon-Young
分类号 H01L29/78 主分类号 H01L29/78
代理机构 代理人
主权项 1. A semiconductor device comprising: a substrate; an isolation film on the substrate; a fin projecting away from the substrate through a recess in the isolation film; a gate electrode that crosses the fin; a source/drain formed on a side of the gate electrode, the source/drain including a first film and a second film; and a stress film that is on a side surface of the fin, the stress film positioned between the isolation film and the source/drain.
地址 Suwon-si KR