System and Method for Gradient Thermal Analysis by Induced Stimulus

摘要

A thermal gradient is induced in a device-under-test (DUT) and used to determine the location of a defect. In one embodiment, a static thermal gradient is induced across at least a portion of the DUT along a first axis. The thermal gradient is incrementally walked along the first axis until the condition associated with the defect is triggered, thereby defining a first region. The thermal gradient is then induced along a second axis of the DUT and the process is repeated to define a second region. The location of the defect is determined to be the intersection of the first region with the second region.

主权项

1. A method, comprising:
creating a quantifiable, precise thermal gradient across a device-under-test (DUT), the thermal gradient being aligned along a first axis of the DUT and encompassing a pre-determined temperature known to trigger a given condition; incrementally moving the thermal gradient along the first axis until the given condition is triggered; identifying a first region of the DUT that is currently at the pre-determined temperature; creating the quantifiable, precise thermal gradient across the DUT and aligned along a second axis of the DUT; incrementally moving the thermal gradient along the second axis until the given condition is triggered; identifying a second region of the DUT that is currently at the pre-determined temperature; and determining the region triggering the given condition to be an intersection of the first region and the second region.