发明名称 |
Semiconductor Device and Method |
摘要 |
A system and method for a semiconductor device are provided. An embodiment comprises a dielectric layer, a hard mask layer over the dielectric layer, and a capping layer over the hard mask layer. A multi-patterning process is performed to form an interconnect using the capping layer as a mask to form an opening for the interconnect. |
申请公布号 |
US2014300000(A1) |
申请公布日期 |
2014.10.09 |
申请号 |
US201313963731 |
申请日期 |
2013.08.09 |
申请人 |
Taiwan Semiconductor Manufacturing Company, Ltd. |
发明人 |
Chao Cha-Hsin;Chen Chih-Hao;Tsai Hsin-Yi |
分类号 |
H01L23/48;H01L21/768 |
主分类号 |
H01L23/48 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor device comprising:
a dielectric layer over a substrate; a nitrogen free anti-reflection layer overlying the dielectric layer; a hard mask over the nitrogen free anti-reflection layer; a capping layer in physical contact with the hard mask, wherein the capping layer has a selectivity to the dielectric layer greater than about 1:5; and an interconnect comprising a trench portion and a via portion, the interconnect extending through the capping layer, the hard mask, and the dielectric layer. |
地址 |
Hsin-Chu TW |