发明名称 Semiconductor Device and Method
摘要 A system and method for a semiconductor device are provided. An embodiment comprises a dielectric layer, a hard mask layer over the dielectric layer, and a capping layer over the hard mask layer. A multi-patterning process is performed to form an interconnect using the capping layer as a mask to form an opening for the interconnect.
申请公布号 US2014300000(A1) 申请公布日期 2014.10.09
申请号 US201313963731 申请日期 2013.08.09
申请人 Taiwan Semiconductor Manufacturing Company, Ltd. 发明人 Chao Cha-Hsin;Chen Chih-Hao;Tsai Hsin-Yi
分类号 H01L23/48;H01L21/768 主分类号 H01L23/48
代理机构 代理人
主权项 1. A semiconductor device comprising: a dielectric layer over a substrate; a nitrogen free anti-reflection layer overlying the dielectric layer; a hard mask over the nitrogen free anti-reflection layer; a capping layer in physical contact with the hard mask, wherein the capping layer has a selectivity to the dielectric layer greater than about 1:5; and an interconnect comprising a trench portion and a via portion, the interconnect extending through the capping layer, the hard mask, and the dielectric layer.
地址 Hsin-Chu TW