发明名称 METHOD FOR STRAIN-RELIEVED THROUGH SUBSTRATE VIAS
摘要 A semiconductor die including strain relief for through substrate vias (TSVs). A method for strain relief of TSVs includes defining a through substrate via cavity in a substrate. The method also includes depositing an isolation layer in the cavity. The method further includes filling the cavity with a conductive material. The method also includes removing a portion of the isolation layer to create a recessed portion.
申请公布号 US2014302674(A1) 申请公布日期 2014.10.09
申请号 US201414311405 申请日期 2014.06.23
申请人 QUALCOMM Incorporated 发明人 RAMACHANDRAN Vidhya;GU Shiqun
分类号 H01L21/768 主分类号 H01L21/768
代理机构 代理人
主权项 1. A method of fabricating a through substrate via, comprising: defining a through substrate via cavity in a substrate; depositing a first isolation layer in the cavity, the first isolation layer having first surface, on a surface of the substrate; filling the cavity with a conductive material; and depositing a second isolation layer surrounding the through substrate via, the second isolation layer comprising a recessed portion to relieve stress from the conductive material and a dielectric portion, the recessed portion in close proximity to an active portion of the substrate, a second surface of the first isolation layer on the second isolation layer, the recessed portion defined between the first isolation layer and the conductive material.
地址 San Diego CA US