发明名称 PATTERN IRRADIATION APPARATUS
摘要 A pattern irradiation apparatus includes a light source unit, an objective that irradiates a sample plane with light emitted from the light source unit, a spatial light modulator of a phase modulation type that is arranged at a position conjugate with a pupil position of the objective and that modulates a phase of the light emitted from the light source unit, a light blocking member that is arranged in an optical path between the spatial light modulator and the objective and that is configured to block 0-order light generated by the spatial light modulator, and a control device that makes a correspondence between a focusing position of the 0-order light generated by the spatial light modulator and a position of the light blocking member.
申请公布号 US2014299742(A1) 申请公布日期 2014.10.09
申请号 US201414228030 申请日期 2014.03.27
申请人 OLYMPUS CORPORATION 发明人 FUJII Shintaro
分类号 G02B21/02 主分类号 G02B21/02
代理机构 代理人
主权项 1. A pattern irradiation apparatus comprising: a light source unit; an objective that irradiates a sample plane with light emitted from the light source unit; a spatial light modulator of a phase modulation type that is arranged at a position conjugate with a pupil position of the objective and that modulates a phase of the light emitted from the light source unit; a light blocking member that is arranged in an optical path between the spatial light modulator and the objective and that is configured to block 0-order light generated by the spatial light modulator; and a control device that makes a correspondence between a focusing position of the 0-order light generated by the spatial light modulator and a position of the light blocking member.
地址 Tokyo JP
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