发明名称 SCANNING-ELECTRON-MICROSCOPE IMAGE PROCESSING DEVICE AND SCANNING METHOD
摘要 The image processing device has: a scanning direction decision unit which divides an captured image into a plurality of scanning regions and deciding a scanning direction of each scanning region based on a pattern edge captured in each scanning region in the captured image, a scanning order decision unit which performs a raster scan per pixel constituting each scanning region such that the scanning direction of each of the decided scanning region is directed to a horizontal direction of the raster scan, and a scanning image acquisition unit which acquires a scanning image by capturing each scanning region by the scanning-electron-microscope based on the decided scanning order.
申请公布号 KR20140119089(A) 申请公布日期 2014.10.08
申请号 KR20147021722 申请日期 2013.02.20
申请人 HITACHI HIGH-TECHNOLOGIES CORPORATION 发明人 SHIMIZU KUMIKO;KAWANO HAJIME
分类号 H01J37/22 主分类号 H01J37/22
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