发明名称 SWEPT ANODE CT SCANNER
摘要 <p>A computed tomography method includes rotating an electron beam along an anode (104) disposed about an examination region (112) for a plurality of sampling intervals in which x-ray projections are sampled. The electron beam is swept during each sampling interval to generate a plurality of successive focal spots at different focal spot locations during each sampling interval, wherein the focal spots generated in a given sampling interval include a sub-set of the focal spots generated in a previous sampling interval. The x-ray projections radiated from each of the plurality of focal spots is sampled during each sampling interval. The resulting data is reconstructed to generate volumetric image data.</p>
申请公布号 EP2081497(B1) 申请公布日期 2014.10.08
申请号 EP20070874422 申请日期 2007.10.16
申请人 KONINKLIJKE PHILIPS N.V. 发明人 HEUSCHER, DOMINIC, J.;LUHTA, RANDALL, P.;CHAPPO, MARC, A.;PIETIG, RAINER
分类号 A61B6/03 主分类号 A61B6/03
代理机构 代理人
主权项
地址
您可能感兴趣的专利