发明名称 FLUORESCENT X-RAY ANALYZER
摘要 Provided is an fluorescent X-ray analyzer in which a variation of the output intensity can be suppressed by a configuration and control which are relatively simple. The fluorescent X-ray analyzer (1) includes: an X-ray source (2) which irradiates a sample (S) with primary X-rays; a light condensing device (3) which condenses the primary X-rays to reduce an irradiation area on the sample; a detector (4) which detects fluorescent X-rays produced from the sample irradiated with the primary X-rays; a casing (5) which accommodates the X-ray source and the light condensing device; a temperature sensor (6) which is disposed in at least one of the X-ray source and the periphery of the X-ray source; at least one external-air fan (7) which is disposed on the casing, and which can exchange internal air with external air; and a control unit (C) which drives the external-air fan based on temperature information detected by the temperature sensor, to adjust the ambient temperature around the X-ray source to a constant temperature.
申请公布号 KR20140118812(A) 申请公布日期 2014.10.08
申请号 KR20140033952 申请日期 2014.03.24
申请人 HITACHI HIGH-TECH SCIENCE CORPORATION 发明人 HIROSE RYUSUKE;TAKAHASHI HARUO;MATOBA YOSHIKI;TAMURA KOICHI
分类号 G01N23/223 主分类号 G01N23/223
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