发明名称 |
FLUORESCENT X-RAY ANALYZER |
摘要 |
Provided is an fluorescent X-ray analyzer in which a variation of the output intensity can be suppressed by a configuration and control which are relatively simple. The fluorescent X-ray analyzer (1) includes: an X-ray source (2) which irradiates a sample (S) with primary X-rays; a light condensing device (3) which condenses the primary X-rays to reduce an irradiation area on the sample; a detector (4) which detects fluorescent X-rays produced from the sample irradiated with the primary X-rays; a casing (5) which accommodates the X-ray source and the light condensing device; a temperature sensor (6) which is disposed in at least one of the X-ray source and the periphery of the X-ray source; at least one external-air fan (7) which is disposed on the casing, and which can exchange internal air with external air; and a control unit (C) which drives the external-air fan based on temperature information detected by the temperature sensor, to adjust the ambient temperature around the X-ray source to a constant temperature. |
申请公布号 |
KR20140118812(A) |
申请公布日期 |
2014.10.08 |
申请号 |
KR20140033952 |
申请日期 |
2014.03.24 |
申请人 |
HITACHI HIGH-TECH SCIENCE CORPORATION |
发明人 |
HIROSE RYUSUKE;TAKAHASHI HARUO;MATOBA YOSHIKI;TAMURA KOICHI |
分类号 |
G01N23/223 |
主分类号 |
G01N23/223 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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