发明名称 TUNABLE LIGHT SOURCE SYSTEM WITH WAVELENGTH MEASUREMENT FOR A HYPER-SPECTRAL IMAGING SYSTEM
摘要 <p>A tunable light source system with wavelength measurement capability for a hyper-spectral imaging system is disclosed. A method includes reference filtering a portion of a tunable light beam while tuning the center wavelength, detecting with at least one photodetector the reference-filtered tunable light beam and generating therefrom at least one detector signal that varies with the center wavelength, and determining a tunable center wavelength based on the at least one detector signal.</p>
申请公布号 EP2786104(A1) 申请公布日期 2014.10.08
申请号 EP20120816160 申请日期 2012.11.29
申请人 CORNING INCORPORATED 发明人 TOVEY, CAMERON JOHN
分类号 G01J3/433;G01J9/00;G01N21/77 主分类号 G01J3/433
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