| 摘要 |
PURPOSE: An electronic component test system is provided to exchange only a sub-system having necessity for replacement by individually operating a loading task, a testing task and an unloading task of electronic components. CONSTITUTION: A loading system(C1) includes a loading device for receiving electronic components to be tested at a test tray. A test system(C2) tests the electronic components trasferred from the loading system. An unloading system(C3) includes an unloading device for unloading a tested electronic components in accordance with a test result. The loading system, the test system and the unloading system are arranged to be separated from one another. A reloading system(C4) is provided with a fault test tray from the loading system. |
