发明名称 |
Integrated system including signal analysis circuit |
摘要 |
An integrated system is provided. The integrated system includes a control system and a signal analysis circuit configured to provide a test signal having a frequency to the control system, receive a feedback signal from the control system, and analyze the test signal and the feedback signal to generate a transfer function of the control system. |
申请公布号 |
US8854051(B2) |
申请公布日期 |
2014.10.07 |
申请号 |
US201213401947 |
申请日期 |
2012.02.22 |
申请人 |
Samsung Electronics Co., Ltd. |
发明人 |
Kim Soo Yong;Mao Xuezhen |
分类号 |
G01R27/28;G01R31/28 |
主分类号 |
G01R27/28 |
代理机构 |
F. Chau & Associates, LLC |
代理人 |
F. Chau & Associates, LLC |
主权项 |
1. An integrated system comprising:
a control system configured to provide a feedback signal based on a previous driving of a target device and an added signal for a current driving of the target device; and a signal analysis circuit configured to provide a test signal having a frequency to the control system, receive the feedback signal and the added signal obtained by adding the feedback signal and the test signal from the control system, and analyze the feedback signal and the added signal to generate a transfer function of the control system, wherein the signal analysis circuit comprises a digital resonator configured to convert a continuous signal into a discrete signal to generate the test signal and provide the test signal to the control system. |
地址 |
Suwon-Si, Gyeonggi-do KR |