发明名称 Multi-tier field-programmable gate array hardware requirements assessment and verification for airborne electronic systems
摘要 A method of verifying a field programmable gate array for use in an integrated system includes selecting, from a set of requirements of the field programmable gate array, a first subset of the requirements that are not influenced by dynamics of the integrated system; selecting, from the set of requirements of the field programmable gate array, a second subset of the requirements that are influenced by the dynamics of the integrated system; executing a hardware test on the field programmable gate array using a chip tester that verifies the first subset of the requirements; and executing a hardware test on the field programmable gate array to verify the second subset of the requirements while the field programmable gate array is installed within the integrated system.
申请公布号 US8856708(B1) 申请公布日期 2014.10.07
申请号 US201313940863 申请日期 2013.07.12
申请人 Hamilton Sundstrand Corporation 发明人 Lillestolen Kirk A.
分类号 G06F17/50 主分类号 G06F17/50
代理机构 Kinney & Lange, P.A. 代理人 Kinney & Lange, P.A.
主权项 1. A method of verifying a field programmable gate array for use in an integrated system, the method comprising: selecting, by a computer, from a set of requirements of the field programmable gate array, a first subset of the requirements that are not influenced by dynamics of the integrated system and are explicit, deterministic and timing independent with respect to inputs of the field programmable gate array; selecting, from the set of requirements of the field programmable gate array, a second subset of the requirements that are influenced by the dynamics of the integrated system and comprise one or more of a timing requirement, an arbitration requirement, a hardware/software integration requirement, an external logic control requirement, a test mode feature requirement, a closed loop operation requirement, and a transient response requirement; executing a first hardware test on the field programmable gate array using a chip tester circuit board that verifies the first subset of the requirements; and executing a second hardware test on the field programmable gate array to verify the second subset of the requirements while the field programmable gate array is installed within the integrated system.
地址 Windsor Locks CT US