发明名称 Method of photolithography using a fluid and a system thereof
摘要 A photolithographic exposure system for use on a photoresist on a substrate includes an illumination system, a photomask with one or more object patterns, a projection optical exposure system, and a fluid dispensing system. The projection optical exposure system is positioned to project an image of the one or more object patterns toward an image plane. The fluid dispensing system positions a fluid between the projection optical exposure system and the photoresist on the substrate. The fluid has a refractive index value above a refractive index value of water and an absorbance below 0.8 per millimeter at wavelengths between about 180 nm and about 300 nm.
申请公布号 US8852850(B2) 申请公布日期 2014.10.07
申请号 US200511049796 申请日期 2005.02.03
申请人 Rochester Institute of Technology 发明人 Smith Bruce W.
分类号 G03F7/00;G03B27/42;G03F7/20 主分类号 G03F7/00
代理机构 Bond Schoeneck & King PLLC 代理人 Noto Joseph M.;Bond Schoeneck & King PLLC
主权项 1. A photolithographic exposure system for use on a photoresist on a substrate, the system comprising: an illumination system which provides a source of radiation; a photomask with one or more object patterns; a projection optical exposure system positioned to project an image of the one or more object patterns towards an image plane on the photoresist using the radiation from the illumination system; and a liquid with additive dispensing system that positions a liquid with at least one inorganic additive at a concentration of at least about 16% between the projection optical exposure system and the photoresist on the substrate, the liquid with the at least one additive has a refractive index value above a refractive index value of water and an absorbance below 0.8 per millimeter at wavelengths below about 300 nm.
地址 Rochester NY US
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