Methods and apparatus for margin testing integrated circuits using asynchronously timed varied supply voltage and test patterns

摘要

Method and apparatus for margin testing integrated circuits. The method includes selecting a clock frequency, an operating temperature range and a power supply voltage level for margin testing an integrated circuit wherein one or more of the clock frequency, the operating temperature range and the power supply voltage level is outside of the normal operating conditions of the integrated circuit; applying an asynchronously time varying power supply voltage set to the selected power supply voltage level to the integrated circuit; running the integrated circuit chip at the selected clock frequency and maintaining the integrated circuit within the selected temperature range; applying a continuous test pattern to the integrated circuit; and monitoring the integrated circuit for fails.

主权项

1. A method, comprising:
selecting a clock frequency, a temperature range and a power supply voltage range for margin testing an integrated circuit wherein one or more of said clock frequency, said temperature range and said power supply voltage range includes a value that is outside of the normal operating conditions of said integrated circuit; applying an asynchronously time varying power supply voltage set to said selected power supply voltage level to said integrated circuit, wherein rising edges of said asynchronously time varying power supply voltage are not synchronous to rising edges of a clock signal used to clock a continuous test pattern into said integrated circuit; running said integrated circuit chip at said selected clock frequency and maintaining said integrated circuit within said selected temperature range; clocking said continuous test pattern to said integrated circuit; and determining if a failure of said integrated circuit has occurred in response to said test pattern.