| 摘要 |
The present invention relates to a testing device for performing a test by electrically connecting a test contact of a subject and a tested contact of a test circuit board. The testing device according to the present invention can include the following elements: a contact support section in which a plate contact is inserted to a slit and supported by the same; a lower socket which is disposed on the test circuit, the bottom plate contact accommodating the lower portion of the contact support portion, the inspected contacts of the test circuit which connect a lower end of the plate contact to the tested contact of the test circuit board by having an upper portion of a contact support portion; and an upper socket which is disposed on the lower socket and which connects an upper end of the plate contact to the test contact of the subject to be tested by having the upper portion of the contact support. According to the present invention, the testing device can simplify the manufacturing process through a simplified structure, thereby reducing costs. |
