摘要 |
An electrical probe assembly includes a first probe housing (14) pivotally connected to a base structure (24) and receiving a first probe (18) therein. The first probe is configured to interface with a first contact of an electrical component. A sec-ond probe housing (16) is pivotally connected to the base structure and receives a second probe (20) therein. The second probe is configured to interface with a second contact of the electrical component wherein the first and second contacts have a spatial rela-tionship therebetween. An adjustment mechanism (32) is connected to the first and second housing and configured to indepen-dently adjust an amount of rotation of the each of the housings to accommodate the spatial relationship. |