发明名称 Phase-change random access memory device and method of manufacturing the same
摘要 A phase-change random access memory (PCRAM) device includes a semiconductor substrate; switching elements formed on the semiconductor substrate; a plurality of phase-change structures formed on the switching elements; and heat absorption layers buried between the plurality of phase-change structures, wherein the plurality of phase-change structures are insulated from the heat absorption layers.
申请公布号 US8853044(B2) 申请公布日期 2014.10.07
申请号 US201314076770 申请日期 2013.11.11
申请人 SK Hynix Inc. 发明人 Park Nam Kyun
分类号 H01L21/20;H01L45/00;H01L27/24 主分类号 H01L21/20
代理机构 IP & T Group LLP 代理人 IP & T Group LLP
主权项 1. A method of manufacturing phase-change random access memory (PCRAM) device, comprising: providing a semiconductor substrate; foaming switching elements on the semiconductor substrate; forming a plurality of phase-change structures on the switching elements; and forming heat absorption layers between the plurality of phase-change structures, wherein the forming each of the plurality of phase-change structures includes: forming a heater material on each of the switching elements;forming a phase-change material on the heater material;forming an upper electrode material on the phase-change material; andetching the heater material, the phase-change material, and the upper electrode material to form a pillar including the lower electrode, the phase-change layer, and the upper electrode.
地址 Gyeonggi-do KR