发明名称 |
Method of manufacturing semiconductor device and semiconductor device |
摘要 |
A method of manufacturing a semiconductor device comprises a mounting step of mounting a semiconductor element having an Au—Sn layer on a substrate, wherein the mounting step includes a paste supplying step of supplying an Ag paste having an Ag nanoparticle onto the substrate, a device mounting step of mounting a side of the Au—Sn layer of the semiconductor element on the Ag paste, and a bonding step of alloying the Au—Sn layer and the Ag paste to bond the semiconductor element to the substrate, wherein the Au—Sn layer has a content rate of Au of 50 at % to 85 at %. |
申请公布号 |
US8853006(B2) |
申请公布日期 |
2014.10.07 |
申请号 |
US201313748255 |
申请日期 |
2013.01.23 |
申请人 |
Toyoda Gosei Co., Ltd. |
发明人 |
Shimonishi Syota;Tajima Hiroyuki;Tsuchiya Yosuke;Sengoku Akira |
分类号 |
H01L21/00;H01L23/00 |
主分类号 |
H01L21/00 |
代理机构 |
McGinn IP Law Group, PLLC |
代理人 |
McGinn IP Law Group, PLLC |
主权项 |
1. A method of manufacturing a semiconductor device, comprising:
mounting a semiconductor element having an Au—Sn layer on a substrate, the mounting of the semiconductor element including supplying an Ag paste having an Ag nanoparticle onto the substrate; mounting a side of the Au—Sn layer of the semiconductor element on the Ag paste; alloying the Au—Sn layer and the Ag paste to bond the semiconductor element to the substrate; and volatilizing a volatile solvent in the Ag paste after the supplying of the Ag paste, wherein during the volatilizing, increasing a temperature of the Ag paste to be in a range of 100° C. to 200° C., and wherein the Au—Sn layer has a content rate of Au of 50 at % to 85 at %. |
地址 |
Kiyosu-Shi, Aichi-Ken JP |