Semiconductor device for supplying and measuring electric current through a pad

摘要

The present invention relates to a semiconductor device, and more particularly, to a semiconductor memory device capable of supplying and measuring an electric current through a pad. The semiconductor device includes a memory cell, a data pad configured to receive data to be programmed into the memory cell or a write current to be supplied to the memory cell from an external device, and output data read out from the memory cell or a cell current flowing from the memory cell to the external device, and a path switching unit configured to set up a path so that the memory cell and the data pad are directly coupled when a test operation is performed.

主权项

1. A semiconductor device, comprising:
a memory cell; a data pad configured to receive data to be programmed into the memory cell or a write current to be supplied to the memory cell and output data read out from the memory cell or a cell current flowing from the memory cell; a sense amplifier configured to read out data stored in the memory cell; an input/output buffer circuit configured to buffer data received through the data pad or drive a signal outputted through the data pad; and a path switching unit connected between the sense amplifier and the input/output buffer circuit, and configured to set up a path so that the memory cell and the data pad are directly coupled when a test operation is performed, and wherein the sense amplifier and the input/output buffer circuit are coupled through a global read data line, and wherein the path switching unit comprises:
a first switching unit connected between the sense amplifier and the global read data line; anda second switching unit connected between the global read data line and the input/output buffer circuit.