发明名称 |
Surface emitting laser device, surface emitting laser array, optical scanning device, image forming apparatus, and manufacturing method of surface emitting laser device |
摘要 |
A disclosed surface emitting laser device includes a light emitting section having a mesa structure where a lower reflection mirror, an oscillation structure, and an upper reflection mirror are laminated on a substrate, the oscillation structure including an active layer, the upper reflection mirror including a current confined structure where an oxide surrounds a current passage region, a first dielectric film that coats the entire surface of an emitting region of the light emitting section, the transparent dielectric including a part where the refractive index is relatively high and a part where the refractive index is relatively low, and a second dielectric film that coats a peripheral part on the upper surface of the mesa structure. Further, the dielectric film includes a lower dielectric film and an upper dielectric film, and the lower dielectric film is coated with the upper dielectric film. |
申请公布号 |
US8855162(B2) |
申请公布日期 |
2014.10.07 |
申请号 |
US201313915921 |
申请日期 |
2013.06.12 |
申请人 |
Ricoh Company, Ltd. |
发明人 |
Shouji Hiroyoshi;Sato Shunichi |
分类号 |
H01S5/00;H01S5/183;B41J2/47;H01S5/32;H01S5/42 |
主分类号 |
H01S5/00 |
代理机构 |
Cooper & Dunham LLP |
代理人 |
Cooper & Dunham LLP |
主权项 |
1. A method of manufacturing a surface emitting device including a mesa structure which becomes a light emitting section in a laminated body where a lower reflection mirror, an oscillation structure, and an upper reflection mirror are laminated on a substrate, the oscillation structure including an active layer, the upper reflection mirror including a current confined structure, and an emitting region including a part where the refractive index is relatively high and a part where the refractive index is relatively low, the method comprising:
forming a first dielectric film on an upper surface of the laminated body before the mesa structure is formed; forming a first resist pattern on an upper surface of the first dielectric film, the first resist pattern including a pattern defining an outer shape of the mesa structure and a pattern protecting a region corresponding to the part where the refractive index is relatively high in the emitting region; etching the first dielectric layer using the first resist pattern as an etching mask; forming a second resist pattern protecting a region corresponding to an entirety of the emitting region; forming the mesa structure; forming the current confined structure; and forming a second dielectric film on an upper surface of the laminated body where the current confined structure is formed, the second dielectric film being formed at a wet etching rate lower than the wet etching rate of the first dielectric film. |
地址 |
Tokyo JP |