发明名称 Large area deposition in high vacuum with high thickness uniformity
摘要 The invention relates to an effusing source for film deposition made of a reservoir comprising one hole characterized by the fact that the hole diameter is less than one order of magnitude than the mean free path of the molecules determined by the pressure and its thickness is at least one order of magnitude smaller than the diameter. Preferably the source has several holes.
申请公布号 US8852344(B2) 申请公布日期 2014.10.07
申请号 US201113280131 申请日期 2011.10.24
申请人 Ecole Polytechnique Federale de Lausanne (EPFL) 发明人 Benvenuti Giacomo;Halary-Wagner Estelle;Amorosi Simone;Hoffmann Patrik
分类号 C23C16/00;C23C16/455;H01L21/306;C30B23/06;C23C14/24 主分类号 C23C16/00
代理机构 Nixon & Vanderhye P.C. 代理人 Nixon & Vanderhye P.C.
主权项 1. A vacuum deposition/etching apparatus in a molecular regime comprising: a deposition chamber with a deposition area, a pre-chamber having a center, wherein said pre-chamber allows irradiation of the deposition area through a void in the center of the pre-chamber,wherein said pre-chamber and said deposition chamber are separated by several apertures,wherein said apertures are fractal sources distributed on an annular geometry, a cryopanel to condense unused precursor molecules, which do not collide directly on the deposition area, and by-products.
地址 Lausanne CH