发明名称 |
X-RAY FLUORESCENCE ANALYZER |
摘要 |
PROBLEM TO BE SOLVED: To provide an X-ray fluorescence analyzer capable of restraining fluctuations of output intensity by a relatively simple configuration and control.SOLUTION: An X-ray fluorescence analyzer 1 comprises: an X-ray source 2 for radiating primary X-rays to a sample S; a light-gathering element 3 for gathering the primary X-rays radiated from the X-ray source 2 and reducing an area for irradiating the sample; a detector 4 for detecting fluorescent X-rays generated from the sample irradiated with the primary X-ray; and a housing 5 for accommodating the X-ray source 2 and the light-gathering element 3. The X-ray fluorescence analyzer 1 further comprises: a temperature sensor 6 mounted on at least one of the X-ray source 2 and the periphery of the X-ray source 2; at least one outside air fan 7 provided on the housing 5, and capable of changing inside air with outside air; and a control section C for driving the outside air fan 7 on the basis of temperature information detected by the temperature sensor 6 and adjusting atmospheric temperature around the X-ray source 2 to be a constant temperature. |
申请公布号 |
JP2014190791(A) |
申请公布日期 |
2014.10.06 |
申请号 |
JP20130065714 |
申请日期 |
2013.03.27 |
申请人 |
HITACHI HIGH-TECH SCIENCE CORP |
发明人 |
HIROSE RYUSUKE;TAKAHASHI HARUO;MATOBA YOSHITAKE;TAMURA KOICHI |
分类号 |
G01N23/223 |
主分类号 |
G01N23/223 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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