发明名称 SINGLE CRYSTAL 4H-SiC SUBSTRATE AND PRODUCTION METHOD THEREOF
摘要 PROBLEM TO BE SOLVED: To provide a single crystal 4H-SiC substrate and a production method thereof capable of reducing crystal defects.SOLUTION: A 4H-SiC bulk single crystal substrate 1 having flatness is prepared. A single crystal 4H-SiC layer 3 having a recessed part 2 is epitaxially grown on the 4H-SiC bulk single crystal substrate 1. When the film thickness of the single crystal 4H-SiC layer 3 is expressed as X[μm], the diameter Y[μm] of the recessed part 2 is 0.2×X[μm] or more and 2×X[μm] or less, and the depth Z[nm] of the recessed part 2 is 0.95×X[μm]+0.5[nm] or more and 10×X[μm] or less.
申请公布号 JP2014189422(A) 申请公布日期 2014.10.06
申请号 JP20130064365 申请日期 2013.03.26
申请人 MITSUBISHI ELECTRIC CORP 发明人 ONO AKIHITO;KAWATSU YOSHIHEI;TOMITA NOBUYUKI;TANAKA TAKANORI;MITANI YOICHIRO;HAMANO KENICHI
分类号 C30B29/36;C23C16/42;C30B25/20;H01L21/205 主分类号 C30B29/36
代理机构 代理人
主权项
地址