发明名称 |
SINGLE CRYSTAL 4H-SiC SUBSTRATE AND PRODUCTION METHOD THEREOF |
摘要 |
PROBLEM TO BE SOLVED: To provide a single crystal 4H-SiC substrate and a production method thereof capable of reducing crystal defects.SOLUTION: A 4H-SiC bulk single crystal substrate 1 having flatness is prepared. A single crystal 4H-SiC layer 3 having a recessed part 2 is epitaxially grown on the 4H-SiC bulk single crystal substrate 1. When the film thickness of the single crystal 4H-SiC layer 3 is expressed as X[μm], the diameter Y[μm] of the recessed part 2 is 0.2×X[μm] or more and 2×X[μm] or less, and the depth Z[nm] of the recessed part 2 is 0.95×X[μm]+0.5[nm] or more and 10×X[μm] or less. |
申请公布号 |
JP2014189422(A) |
申请公布日期 |
2014.10.06 |
申请号 |
JP20130064365 |
申请日期 |
2013.03.26 |
申请人 |
MITSUBISHI ELECTRIC CORP |
发明人 |
ONO AKIHITO;KAWATSU YOSHIHEI;TOMITA NOBUYUKI;TANAKA TAKANORI;MITANI YOICHIRO;HAMANO KENICHI |
分类号 |
C30B29/36;C23C16/42;C30B25/20;H01L21/205 |
主分类号 |
C30B29/36 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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