发明名称 EMITTER STRUCTURE, GAS ION SOURCE, AND FOCUSED ION BEAM DEVICE
摘要 PROBLEM TO BE SOLVED: To provide an emitter structure which can enhance the cooling efficiency of an emitter, and can hold the emitter stably with high accuracy for a base member, while reducing the number of components or simplifying the device, and to provide a gas ion source and a focused ion beam device.SOLUTION: An emitter structure includes a pair of electrification pins 65 fixed to a base material 61, a filament 66 connected between the pair of electrification pins 65, and an emitter 52 connected with the filament 66 and having a sharpened tip. A support member 54 is fixed to the base material 61, and the emitter 52 is connected with the support member 54.
申请公布号 JP2014191872(A) 申请公布日期 2014.10.06
申请号 JP20130063707 申请日期 2013.03.26
申请人 HITACHI HIGH-TECH SCIENCE CORP 发明人 YASAKA KOJIN;SUGIYAMA YASUHIKO;OBA HIROSHI
分类号 H01J27/26 主分类号 H01J27/26
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