| 摘要 |
<p>PROBLEM TO BE SOLVED: To provide an observation device that allows a high SNR to observe a fine specimen.SOLUTION: An observation device comprises: a conductor thin film 22 that has an aperture 22a smaller than a wavelength of a terahertz wave; an electro optical crystal 21 that has a loading plane 21a on which an observed object S is loaded; a first irradiation system 15 that irradiates the conductor thin film 22 with a pulse-like terahertz wave; a second irradiation system that irradiates the electro optical crystal 21 with a pulse-like second electromagnetic wave shorter in the wavelength than the terahertz wave; and a detection system that detects a polarization status of the second electromagnetic wave propagating the electro optical crystal 21. The conductor thin film 22 is arranged so that the aperture 22a is located on the loading plane 21a, and the first irradiation system 15 allows the terahertz wave to pass through the aperture 22a and the observed object S, and irradiates the electro optical crystal 21 with the terahertz wave. The second irradiation system irradiates the electro optical crystal 21 with the second electromagnetic wave so that, within the electro optical crystal 21, a part of the second electromagnetic wave overlaps with the terahertz wave passing through the aperture 22a and the observed object S.</p> |
