发明名称 FOREIGN SUBSTANCE INSPECTION APPARATUS AND FOREIGN SUBSTANCE INSPECTION METHOD
摘要 <p>PROBLEM TO BE SOLVED: To provide a foreign substance inspection apparatus and a foreign substance inspection method capable of correctly detecting a foreign substance existing in an object to be inspected and the amount of the foreign substance, and determining the quality of the object to be inspected with high accuracy.SOLUTION: A foreign substance inspection apparatus 100a comprises a sample table 3, an illumination section 1a, and a detection section 2 for detecting light from the illumination section 1a. The detection section 2 is disposed at such a position as to be capable of detecting light 11b scattered in scattering directions A, B on a straight line differing from a direction in which light 11a from the illumination section 1a travels. The detection section 2 adjusts focus by relatively moving with respect to the sample table 3 in a direction along the scattering directions so as to detect the existence of an imaged foreign substance 12 and the position of the foreign substance 12.</p>
申请公布号 JP2014185903(A) 申请公布日期 2014.10.02
申请号 JP20130060051 申请日期 2013.03.22
申请人 MITSUBISHI ELECTRIC CORP 发明人 ENDO YASUHIRO;NOGUCHI TAKUYA;NIMURA MASANORI
分类号 G01N21/896;G01B11/00;G01B11/28 主分类号 G01N21/896
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