发明名称 ANALYSIS SYSTEM, ANALYZER, AND PLACEMENT PART
摘要 <p>PROBLEM TO BE SOLVED: To provide an analysis system, an analyzer, and a placement part which are capable of more surely detecting an area corresponding to a measurement object.SOLUTION: A food analysis system 1 includes a placement part 2 of which the placement surface 21 on which a measurement object food item X is placed has a prescribed reflection spectrum, and a food analyzer 10 which acquires spectral images corresponding to a plurality of wavelengths from incident light from the placement part 2 and detects object pixels being pixels corresponding to the measurement object food item X, from the acquired spectral images. The food analyzer 10 includes a pixel detection unit which acquires a spectral spectrum of each pixel on the basis of the quantity of light of the pixel in the spectral images corresponding to the plurality of wavelengths and detects pixels of which the spectral spectrum substantially match the reflection spectrum of the placement surface 21, as background pixels corresponding to the placement surface 21 and detects pixels other than the background pixels as object pixels.</p>
申请公布号 JP2014185959(A) 申请公布日期 2014.10.02
申请号 JP20130061551 申请日期 2013.03.25
申请人 SEIKO EPSON CORP 发明人 URUSHIYA TANIO
分类号 G01N21/27;G01N21/359;G02B26/00 主分类号 G01N21/27
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