发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR ELEMENT AND DEPOSITION APPARATUS
摘要 An object of the present invention is to provide an apparatus for successive deposition used for manufacturing a semiconductor element including an oxide semiconductor in which impurities are not included. By using the deposition apparatus capable of successive deposition of the present invention that keeps its inside in high vacuum state, and thus allows films to be deposited without being exposed to the air, the entry of impurities such as hydrogen into the oxide semiconductor layer and the layer being in contact with the oxide semiconductor layer can be prevented; as a result, a semiconductor element including a high-purity oxide semiconductor layer in which hydrogen concentration is sufficiently reduced can be manufactured. In such a semiconductor element, off-state current is low, and a semiconductor device with low power consumption can be realized.
申请公布号 US2014290569(A1) 申请公布日期 2014.10.02
申请号 US201414302815 申请日期 2014.06.12
申请人 Semiconductor Energy Laboratory Co., Ltd. 发明人 YAMAZAKI Shunpei;TAKASE Natsuko
分类号 C23C16/44 主分类号 C23C16/44
代理机构 代理人
主权项 1. A deposition apparatus comprising: a load lock chamber connected to a unit capable of evacuating the load lock chamber to have a pressure of 10−6 Pa or less; a plurality of deposition chambers each being connected to a unit capable of evacuating the deposition chamber to have a pressure of 10−8 Pa or less; a heating chamber connected to a unit capable of evacuating the heating chamber to have a pressure of 10−8 Pa or less; and a transfer chamber connected to the load lock chamber, the heating chamber, and the plurality of deposition chambers through gate valves and connected to a unit capable of evacuating the transfer chamber to have a pressure of 10−6 Pa or less.
地址 Atsughi-shi JP