X-RAY RECORDING SYSTEM FOR X-RAY IMAGING AT HIGH IMAGE FREQUENCIES OF AN OBJECT UNDER EXAMINATION BY WAY OF DIRECT MEASUREMENT OF THE INTERFERENCE PATTERN

摘要

An x-ray recording system is disclosed for x-ray imaging of an object under examination by way of direct measurement of an interference pattern, especially for differential, real-time capable phase-contrast imaging. In at least one embodiment, the system includes with at least one x-ray emitter for creating quasi-coherent x-ray radiation; an x-ray image detector, including a detector layer and detector pixels arranged in a matrix; and a diffraction or phase grating, disposed between the object under examination and the x-ray image detector, configured to create an interference pattern, directly detectable in the nth Talbot order by an x-ray image detector with a very high achievable local resolution, which amounts to at least half the wavelength of the interference pattern in accordance with the Nyquist theory arising in the nth Talbot order.

主权项

1. An x-ray recording system for x-ray imaging of an object under examination via direct measurement of an interference pattern, the x-ray recording system comprising:
at least one x-ray emitter, configured to generate quasi-coherent x-ray radiation; an x-ray image detector, including a detector layer and detector pixels disposed in a matrix; and a diffraction or phase grating, disposed between the object under examination and the x-ray image detector, configured to create an interference pattern, the interference pattern in the nth Talbot order being directly detectable by the x-ray image detector, including a very high achievable local resolution, which at least amounts to half the wavelength of the interference pattern in accordance with the Nyquist theory arising in the nth Talbot arrangement.