| 摘要 |
PROBLEM TO BE SOLVED: To improve accuracy of physical failure analysis.SOLUTION: A physical failure analysis device extracts a plurality of failure candidate nets of each chip where a physical failure has occurred, assumes that there is a failure net in each failure chip, and constructs a plurality of failure rate calculation models obtained by combining failure nets (a step S204); and on the basis of an estimation value of a failure rate calculated by the constructed failure rate calculation model and a failure rate of actual failure data of a chip where a physical failure has occurred, acquires an optimal failure rate calculation model obtained by combining the failure nets (a step S207). |
