| 摘要 |
<p>PROBLEM TO BE SOLVED: To provide a reference voltage generation circuit having a flat temperature characteristic even when there are manufacturing process variations.SOLUTION: After a semiconductor manufacturing process is complete, the electric characteristic of a semiconductor device is evaluated. At this point, the temperature characteristic of each reference voltage VREF of three unit reference voltage generation circuits 10 is also evaluated. Then, only a unit reference voltage generation circuit 10 having the most flat temperature characteristic is selected from among the three unit reference voltage generation circuits 10. Only fuses 13-14 of the selected unit reference voltage generation circuit 10 are not disconnected, but other fuses 13-14 are disconnected. Accordingly only the selected unit reference voltage generation circuit (10) operates, and the other unit reference voltage generation circuits (10) do not operate.</p> |
