发明名称 METHOD OF FORMING AN INTEGRATED CIRCUIT
摘要 A method of forming an integrated circuit includes forming a patterned mask layer on a material layer, the patterned mask layer having a plurality of first features with a first pitch. The method includes patterning the material layer by using the patterned mask layer as a mask to form the first features in the material layer. The method includes trimming the patterned mask layer, after patterning the material layer, to form a trimmed patterned mask layer. The method further includes introducing a plurality of dopants into the material layer exposed by the trimmed patterned mask layer to form doped regions having a second pitch, wherein the second pitch is different from the first pitch. The method further includes removing the trimmed patterned mask layer to expose un-doped regions in the material layer; and removing the un-doped regions to form a plurality of second features corresponding to the respective doped regions.
申请公布号 US2014295654(A1) 申请公布日期 2014.10.02
申请号 US201414304022 申请日期 2014.06.13
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 HSIEH Tzu-Yen;MING-CHING Chang;LEE Chun-Hung;LIN Yih-Ann;CHEN De-Fang;CHEN Chao-Cheng
分类号 H01L21/265;H01L21/311 主分类号 H01L21/265
代理机构 代理人
主权项 1. A method of forming an integrated circuit, the method comprising: forming a patterned mask layer on a material layer, the patterned mask layer having a plurality of first features with a first pitch; patterning the material layer by using the patterned mask layer as a mask to form the first features in the material layer; trimming the patterned mask layer, after patterning the material layer, to form a trimmed patterned mask layer; introducing a plurality of dopants into the material layer exposed by the trimmed patterned mask layer to form doped regions having a second pitch, wherein the second pitch is different from the first pitch; removing the trimmed patterned mask layer to expose un-doped regions in the material layer; and removing the un-doped regions to form a plurality of second features corresponding to the respective doped regions.
地址 Hsinchu TW