发明名称 STAINLESS STEEL FOR CUTLERY AND METHOD OF MANUFACTURING THE SAME
摘要 The present invention has the ultimate purpose of obtaining cutlery having marked characteristics such as high hardness and high toughness, and provides an intermediate material, an annealed material, and a cold-rolled steel strip for stainless steel for cutlery, and a method for manufacturing them to achieve the purpose. Provided is an intermediate material for stainless steel for cutlery, the intermediate material being a material after hot rolling but before annealing, having a composition, in terms of % by mass, of from 0.46 to 0.72% C, from 0.15 to 0.55% Si, from 0.45 to 1.00% Mn, from 12.5 to 13.9% Cr, from 0 to 1.5% Mo, from 0 to 0.012% B, and the balance being Fe and impurities; and wherein a ratio of a diffraction peak area from an fcc phase (a sum total of diffraction peak areas from (200) plane, (220) plane, and (311) plane) to a diffraction peak area from a bcc phase (a sum total of diffraction peak areas from (200) plane and (211) plane) (the diffraction peak area from the fcc phase/the diffraction peak area from the bcc phase) is 30 or less in an X-ray diffraction of a vertical section.
申请公布号 US2014294662(A1) 申请公布日期 2014.10.02
申请号 US201214346740 申请日期 2012.09.14
申请人 Ueno Tomonori;Yoshiyama Goh;Kishigami Ichiro 发明人 Ueno Tomonori;Yoshiyama Goh;Kishigami Ichiro
分类号 C22C38/54;C22C38/50;C22C38/46;B21B3/02;C22C38/06;C22C38/04;C22C38/02;C22C38/00;C21D8/02;C22C38/44 主分类号 C22C38/54
代理机构 代理人
主权项 1. An intermediate material for stainless steel for cutlery, the intermediate material being a material after hot rolling but before annealing, having a composition, in terms of % by mass, of from 0.46 to 0.72% C, from 0.15 to 0.55% Si, from 0.45 to 1.00% Mn, from 12.5 to 13.9% Cr, from 0 to 1.5% Mo, from 0 to 0.012% B, and the balance being Fe and impurities; and wherein a ratio of a diffraction peak area from an fcc phase (a sum total of diffraction peak areas from (200) plane, (220) plane, and (311) plane) to a diffraction peak area from a bcc phase (a sum total of diffraction peak areas from (200) plane and (211) plane) (the diffraction peak area from the fcc phase/the diffraction peak area from the bee phase) is 30 or less in an X-ray diffraction of a vertical section.
地址 Yasugi-shi JP