发明名称 METHOD FOR AUTOMATICALLY GENERATING TEACHING DATA OF AUTOMATED OPTICAL INSPECTION MACHINE
摘要 <p>The present invention relates to a method for automatically generating teaching data of an automated optical inspection (AOI) machine, which automatically recognizes a teaching start point and a teaching end point through pattern matching for predetermined solder shape information, without external information such as a Gerber-file or a manual teaching process performed by an operator, and sequentially and repeatedly searches whether brightness values for each position within an image satisfy predetermined conditions, and thus can automatically obtain a link (wiring) path for connecting the teaching start point and the teaching end point.</p>
申请公布号 WO2014157920(A1) 申请公布日期 2014.10.02
申请号 WO2014KR02507 申请日期 2014.03.25
申请人 MIRTEC CO., LTD 发明人 PARK, CHAN WHA;CHO, YOUNG IL;KIM, TAE JUN
分类号 G06F19/00;G01B11/30;G01N21/88;H05K13/08 主分类号 G06F19/00
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