发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 A highly reliable semiconductor device which includes a transistor including an oxide semiconductor is provided. In the semiconductor device including a bottom-gate transistor including an oxide semiconductor layer, a stacked layer of an insulating layer and an aluminum film is provided in contact with the oxide semiconductor layer. Oxygen doping treatment is performed in such a manner that oxygen is introduced to the insulating layer and the aluminum film from a position above the aluminum film, whereby a region containing oxygen in excess of the stoichiometric composition is formed in the insulating layer, and the aluminum film is oxidized to form an aluminum oxide film.
申请公布号 US2014295617(A1) 申请公布日期 2014.10.02
申请号 US201414306566 申请日期 2014.06.17
申请人 Semiconductor Energy Laboratory Co., Ltd. 发明人 YAMAZAKI Shunpei
分类号 H01L29/66;H01L27/12;H01L29/786 主分类号 H01L29/66
代理机构 代理人
主权项 1. (canceled)
地址 Atsugi-shi JP