TESTING DEVICE, AND TESTING METHOD

摘要

PROBLEM TO BE SOLVED: To reduce the length of time required for testing.SOLUTION: A testing device comprises a testing unit that tests a circuit with a test pattern and a control unit that determines a period K of clock signals for synchronizing the test pattern on the basis of the operating speed of the circuit. A testing method comprises steps of testing a circuit with a test pattern and determining the period K of clock signals for synchronizing the test pattern on the basis of the operating speed of the circuit.