发明名称 |
AUTOMATIC FEATURE-DRIVEN TESTING AND QUALITY CHECKING OF APPLICATIONS |
摘要 |
A method of feature-driven testing by one or more computing devices includes determining a graphical user interface (GUI) model of an application, determining an application-independent feature of a platform, augmenting the GUI model to reflect the application-independent feature resulting in an augmented model, and determining a test case from the augmented model. The test case includes the application-independent feature. The application is to be executed on the platform. The GUI model includes states and transitions. |
申请公布号 |
US2014298297(A1) |
申请公布日期 |
2014.10.02 |
申请号 |
US201313851818 |
申请日期 |
2013.03.27 |
申请人 |
FUJITSU LIMITED |
发明人 |
Prasad Mukul R.;Zaeem Razieh Nokhbeh |
分类号 |
G06F11/36 |
主分类号 |
G06F11/36 |
代理机构 |
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代理人 |
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主权项 |
1. A method of feature-driven testing by one or more computing devices comprising:
determining a graphical user interface (GUI) model of an application, the application to be executed on a platform, the GUI model including states and transitions; determining an application-independent feature of the platform; augmenting the GUI model to reflect the application-independent feature resulting in an augmented model; and determining a test case from the augmented model, the test case including the application-independent feature. |
地址 |
Kanagawa JP |