| 摘要 |
<p>PROBLEM TO BE SOLVED: To precisely measure optical characteristics of a display device or the like by excluding an influence of flicker in a shorter time.SOLUTION: A measurement instrument picks up images by an imaging unit for a time length of a period of flicker as a measurement object with a measurement period shorter than the flicker period to acquire a measurement value in the measurement period. The measurement instrument calculates a phase of flicker on the basis of the acquired measurement value and specifies a timing when a prescribed value of the flicker appears for the first time after the elapse of the time length of the flicker period from the start of measurement of the flicker, on the basis of the phase of the flicker and calculates a delay time for synchronization with the timing. After the elapse of the delay time, the measurement instrument picks up images by the imaging unit to acquire a measurement value.</p> |
